Emerging Nanotechnologies -Test Defect Tolerance and...

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Emerging Nanotechnologies -Test Defect...

Emerging Nanotechnologies -Test Defect Tolerance and Reliability -SP

Name: Emerging Nanotechnologies -Test Defect Tolerance and Reliability -SP
ISBN: 9780387307510

written by Katarzyna Radecka, Zeljko Zilic.

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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500.

种类:

Computers - Hardware

年:

2008

出版社:

KLUWER

语言:

english

页:

411

ISBN 10:

0387307516